White Paper Adding High Value Services to Flight Test Instrumentation without Compromising Reliability The benefits of using value-added services and how this can be achieved without disrupting core data acquisition. 04/10/2017
White Paper Machine Learning Techniques for Extending BIT Coverage to Sensor Faults In this paper, we describe the problem of developing sensor fault detection within airborne instrumentation systems, and solutions based on machine-learning techniques. 04/07/2017
